A physicist specializing in X-ray microscopy and X-ray imaging systems with more than 10 years of experience in the design, development, and application of advanced imaging technologies, this expert provides technical analysis in matters involving X-ray imaging instrumentation, microscopy systems, and related imaging algorithms. The expert offers services as an X-ray technologist expert witness, evaluating technologies associated with X-ray microscopy, imaging system design, and imaging data analysis. Professional work focuses on the development and advancement of high-resolution X-ray microscopy and computed tomography systems. Technical expertise includes contrast scanning microscopy using segmented detectors, X-ray optics design, X-ray detectors, and three-dimensional X-ray imaging systems. Additional experience involves the development of algorithms for two- and three-dimensional image enhancement, reconstruction, and analysis, including automated and semi-automated data analysis using deterministic and machine learning methods. The expert’s broader microscopy experience also includes high-resolution optical, electron, and ion microscopy systems, as well as work involving X-ray fluorescence imaging and spectrometry.

Leadership roles in imaging technology development have included executive and research leadership responsibilities in organizations focused on advanced X-ray microscopy technologies. Professional positions have included Chief Executive Officer and member of a board of directors at a company developing compact X-ray source technology, as well as prior roles overseeing advanced development, research and development programs, and technology strategy for X-ray microscopy systems. These roles have involved directing product development initiatives, managing interdisciplinary engineering teams, and coordinating federally funded research programs supporting advanced imaging technologies. Academic training includes a Doctor of Philosophy in Physics focused on scanning X-ray microscope instrumentation and image restoration. Additional research experience includes postdoctoral work in phase-contrast X-ray imaging. Professional expertise encompasses the theory and application of diffractive, reflective, and transmissive X-ray optics, nanofabrication techniques, complex positioning systems, and interferometry used in high-resolution imaging instrumentation.