Expertise DescriptionI have over 10 years experience working in X-ray Microscopy. My areas of expertise include: contrast scanning microscopy using segmented detectors; x-ray imaging; x-ray optics; x-ray detectors; 3-D x-ray imaging systems; x-ray radiation exposure and dosimetry; algorithms for 2-D and 3-D image enhancement, reconstruction and analysis; automatic and semi-automatic data analysis using deterministic and machine learning algorithms; high-resolution optical, electron and ion microscopy systems. I am offering my services as an X-ray technologist expert witness.
Areas of Expertise
|Ph.D.||Physics||State University of New York at Stony Brook – NY|
Awards & Affiliation